• March 30, 2007

  Statistics' William Meeker receives Shewhart Medal

• William Meeker, Distinguished Professor of liberal arts and sciences and professor of statistics at Iowa State University, has been awarded the Shewhart Medal from the American Society for Quality.
  
  At the same time, the long-time Iowa State faculty member has also been named a Fellow of that organization.
  
  The Shewhart Medal is awarded for technical leadership to an individual "who is deemed to have demonstrated the most outstanding technical leadership in the field of modern quality control, especially through the development of its theory, principles and techniques."
  
  Meeker has long been a leader in the fields of quality and product reliability. In addition to his faculty responsibilities at Iowa State, he spent his summers at Bell Laboratories from 1978-92. He has also worked with General Electric, Hewlett-Packard, 3M and other companies on developing statistical models and methods for reliability.
  
  He is the co-author on two books related to product reliability including Statistical Intervals: A Guide for Practitioners (1991) and Statistical Methods for Reliability Data (1998) and served as the editor of the Technometrics, which is published jointly by the American Society of Quality and the American Statistical Association.
  
  Meeker and his colleagues have, throughout his career, continually developed new ideas and technology often building on past work. He parlayed that into software that is used for planning and analyzing data from reliability studies.

William Meeker